Topic: Calculating FWHM|| Peak Position (2 theta)|| XRD
Tutor: Rworld
About: In this blog, we are going to learn how to calculate the full width half maxima (FWHM) and peak positions (2theta) of a sample compound from XRD data by using origin software. The steps are quite simple, which you can easily learn through the embedded video. The video linked below has been shared by the "Research World".
XRD: X-ray differection (XRD) is a powerful technique for the characterization of a crystalline material. It is a non-destructive technique; means a sample is being tested without any permanent alteration or damage. One can get information about the structures, phases, preferred crystal orientations (texture), and details about a crystal compound from XRD. X-ray diffractometers consists of: an
X-ray tube, a sample holder, and an X-ray detector For more details, a free research article link has been given below in this regards.
X-Ray_Diffraction_Instrumentation_and_Applications
FWHM: Most of the times students and researchers ask about calculating full width at half maxima using origin. Origin is a great tool to determine the FWHM. You just need to plot the file in origin (a paid software but trial version is available on origin website) and select the type of the line profile;like Gaussian , Lorentzian or Voigt. It is always easy to fit a single line plot. The only thing you need to do is click the analysis on the top layer that will give you a number of options. Now, select 'single peak'. It will immediately give you a fitted profile along with the experimental data. A small window on the profile will give you the central wavelength, FWHM, Area and peak height. Watch the above video for more details.
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